What we Do
Spectral Chip Test Research LLC is a Semiconductor Point Solution provider for organizations seeking productivity improvements in circuit testing. It provides logic and memory test solutions for Semiconductor Industry Customers seeking improved productivity. Our mission is to solve test problems in IC design with an in-house team of domain experts. We offer solutions and specialized services in the fields of Test and Design-For-Test.
THE PROBLEM: SemiconductorTest Costs are Way Too High at 25 to 40% of Total Chip Cost THE SOLUTION: Reduce TAT (Test Application Time) by 64% with New Spectral Method
> The Main Cause of Cost Pressure is Increased Density as Feature Size is Scaling
Down from 40 nm to 22 to 14 to 7 to 5 to 3.
> Result:
• Time Needed to Test a Chip (Test Application Time or TAT) Increases with
Density, but at a Faster Rate.
• Testers (Automatic Test Equipment or ATE) are expensive and their cost rises
with TAT.
> Method uses Patented Algorithms in an interative process to create test conditions
for chips & desired operational responses.
• These conditions and responses are Test Vectors that detect faults in chips.
• Need Millions of Vectors to attain 100% fault coverage
• Use U.S. Patents # 8,164,345 and Provisional # 63/413,393 to do this
– TAT and thus costs are reduced by:
○ Random vector generation and analysis of tests to find which digital
frequencies expose the most faults.
○ In an iterative process, generate future vectors that are biased to include
only those useful frequencies.
> Generate self-testing hardware for digital logic from test vectors produced by the
method.
Our Spectral Method reduces number of tests and TAT by 64% – Reduces chip cost by 16%, assuming that test is 25% of chip cost • We will build logic-testing hardware into chips to boost savings – Targeting the Auto and Defense industries
