Results

> EntropyDFT Results on Benchmarks: on very large industrial results, EntropyDFT TM: • Improved stuck-fault test cov. by up to 13.60%. • Reduced stuck-fault test count by up to 26.83%. • Improved transition test cov. by up to 23.99%. • Reduced transition test count by up to 77.23%. > EntropyXZ Results on Benchmarks: on very large industrial results, EntropyXZ TM: • Improved stuck-fault test cov. by up to 13.60%. • Reduced stuck-fault test count by up to 26.83%. • Improved transition test cov. by up to 23.99%. • Reduced transition test count by up to 77.23%. • On a microprocessor, it recovered 1431 lost faults with only 7 test points (<< 0.5% overhead).
> Spectral Test Gen. & Test Point Inserter (LP + Entropy) Advantages • Results on circuits s298-s38584 from 4 IEEE Conf. Papers & 2 U.S. Patents • Linear Programming + Entropy Fault Cov. 98.46% ≈ TRAN (NEC Automatic Test Pattern Generator (ATPG)) 98.56% • Linear Programming (LP) method is vastly superior to others