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Spectral's foundational test point insertion patent is granted

U.S. Patent 8,164,345 has been granted, covering Spectral's original method for spectral and information-theoretic test point and scan flip-flop insertion.

The patent describes using spectral analysis and information entropy together to decide where partial-scan flip-flops and test points belong in a circuit — the mathematics competitors still do not use.

It is the foundation Spectral's test point inserters, including Logic TPI, are built on today, and the work that led to it was first published as SPARTAN in 2007.