October 2026
Spectral presents its RTL entropy paper at ITC 2026
Spectral Chip Test attended the IEEE 2026 International Test Conference and successfully presented its paper on register-transfer-level test point insertion.
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August 2026
Spectral Chip Test at ITC 2026 for its RTL TPI work!
Our paper on register-transfer-level test point insertion has been accepted into this year's International Test Conference.
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July 2026
Spectral files a third patent on RTL-level spectral entropy test insertion
The application extends Spectral's spectral-entropy method to register-transfer-level test point insertion, the same approach behind our upcoming RTL TPI product.
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December 2024
Spectral's patent application for smarter test point grading approved for issue
The filing covers a method for blocking unknown signals and grading candidate test point sites from untestable-fault estimates, sharpening how Spectral chooses where to insert test hardware.
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April 2012
Spectral's foundational test point insertion patent is granted
U.S. Patent 8,164,345 covers Spectral's method for using spectral and information-theoretic analysis to place test points and scan flip-flops — the core idea behind our test point inserters today.
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October 2007
Spectral publishes SPARTAN at the International Test Conference
The paper introduced Spectral's spectral and information-theoretic approach to partial-scan design — the analysis method our tools still build on.
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May 2007
Spectral presents SPARTAN at the North Atlantic Test Workshop
An earlier presentation of the same spectral and information-theoretic partial-scan approach, ahead of that year's full conference paper.
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